Testing apparatus with high efficiency and high accuracy

Details Testing apparatus with high efficiency and high accuracy Testing apparatus with high efficiency and high accuracy

2010-04-26

2011-10-25

Phan, Huy Q (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

08044675

ABSTRACT:
A testing apparatus includes a public test board, a single DUT (device under test) test board and a holder. The public test board includes a plurality of public test channel sets each having a plurality of public signal terminals for receiving test signals. On the single DUT test board, a plurality first signal terminals are arranged according to the pin layout of a DUT, a plurality second signal terminals are arranged according to the terminal layout of a public channel set, and a plurality traces are arranged for electrically connecting corresponding first and second signal terminals. The holder can connect the pins of the DUT to corresponding first signal terminals.

REFERENCES:
patent: 5907245 (1999-05-01), Fredrickson
patent: 6625557 (2003-09-01), Perkins et al.
patent: 6759842 (2004-07-01), Weimer
patent: 7602201 (2009-10-01), Ysaguirre et al.
patent: 2007/0001702 (2007-01-01), Takasu et al.

Affiliated with

Also associated with

Rating

Testing apparatus with high efficiency and high accuracy does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing apparatus with high efficiency and high accuracy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing apparatus with high efficiency and high accuracy will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4278359