Testing apparatus, testing method, jitter filtering circuit,...

Details Testing apparatus, testing method, jitter filtering circuit,... Testing apparatus, testing method, jitter filtering circuit,...

2008-07-01

2008-07-01

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C702S069000, C375S226000

Reexamination Certificate

active

07394277

ABSTRACT:
There is provided a testing apparatus for evaluating a device-under-test, having an extracting section for extracting jitter components out of an output signal outputted out of the device-under-test, a filter for passing predetermined frequency components in the jitter components, a phase control section for controlling phase of the output signal based on the jitter components outputted out of the filter and an evaluating section for evaluating the device-under-test based on a signal outputted out of the phase control section.

REFERENCES:
patent: 7136773 (2006-11-01), Ishida et al.
patent: 2005/0075810 (2005-04-01), Laquai
patent: 2007/0239388 (2007-10-01), Ichiyama et al.
patent: 2005-75573 (1993-03-01), None
patent: 2003-27380 (2003-09-01), None
patent: 2005-49233 (2005-02-01), None
patent: WO 2006-100745 (2006-09-01), None
Japan Patent Office. PCT International Search Report dated Jul. 17, 2007. International Application No.: PCTJP2007/058117. International Filing Date: Apr. 12, 2007. Japanese Language Translation. 3 pages.

Affiliated with

Also associated with

Rating

Testing apparatus, testing method, jitter filtering circuit,... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing apparatus, testing method, jitter filtering circuit,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing apparatus, testing method, jitter filtering circuit,... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2814206