Testing apparatus, and testing method

Details Testing apparatus, and testing method Testing apparatus, and testing method

2007-11-27

2007-11-27

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C324S760020, C324S754090

Reexamination Certificate

active

11418576

ABSTRACT:
Here is provided a testing apparatus for judging whether or not a device-under-test is defect-free based on static power-supply current of the device-under-test, having a power supply for supplying power for driving the device-under-test to the device-under-test, a pattern generating section for supplying setting vectors for setting a circuit of the device-under-test into a predetermined state to the device-under-test, a power-supply current measuring section for measuring the static power-supply current supplied from the power supply to the device-under-test when the device-under-test is set into the predetermined state by the setting vectors and a judging section for obtaining temperature of the device-under-test from a temperature sensor provided within the device-under-test to judge whether or not the device-under-test is defect-free based on the static power-supply current measured by the power-supply current measuring section and the temperature of the device-under-test.

REFERENCES:
patent: 6400173 (2002-06-01), Shimizu et al.
patent: 7183784 (2007-02-01), Maggi et al.
patent: 2002/0186031 (2002-12-01), Pelissier
patent: 2006/0164111 (2006-07-01), Lopez et al.
patent: 2006/0250152 (2006-11-01), Rius Vazquez et al.

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