Testing apparatus and method for providing temperature...

Details Testing apparatus and method for providing temperature... Testing apparatus and method for providing temperature...

2007-10-16

2007-10-16

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S760020

Reexamination Certificate

active

11293146

ABSTRACT:
An improved apparatus and method for testing experiment is disclosed. The apparatus includes a motherboard and a stress module. The motherboard includes a component under test. A stress module connects the component and contacts the component directly. The stress module can provide the component with various rages of temperature and voltage for test. Besides, the stress module also can provide an anti-electrostatic device to prevent electrostatic disturbance.

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