Testing apparatus

Details Testing apparatus Testing apparatus

2006-08-22

2006-08-22

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S108000, C702S118000, C702S120000, C324S073100

Reexamination Certificate

active

07096139

ABSTRACT:
A testing apparatus having testing module slots onto which different types of testing modules are selectively mounted includes controlling modules for supplying control signals to the testing modules mounted on the testing module slots. The control signals are used for controlling the testing module. The apparatus also includes a setting information supplying unit for supplying hardware setting information to a specific testing module, an enable signal controlling unit for instructing the specific testing module to generate and supply an enable signal to the controlling module corresponding to the specific testing module, and a setting unit for setting the controlling module received said enable signal from the specific testing module so as to supply the control signal corresponding to the specific testing module based on the hardware setting information.

REFERENCES:
patent: 5638383 (1997-06-01), Wotzak et al.
patent: 5777873 (1998-07-01), Cox et al.
patent: 6101457 (2000-08-01), Barch et al.
patent: 2003/0009715 (2003-01-01), Ricchetti et al.
patent: 60-135777 (1985-07-01), None
patent: 63-298174 (1988-12-01), None
patent: 2001-51026 (2001-02-01), None
patent: 2002-131392 (2002-05-01), None
Translation of JP-2002-131392.
Translation of JP-60-135777.
Translation of JP-63-298174.
International Search Report Issued for PCT/JP2005/002350 mailed on May 31, 2005, 6 pages.

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