Testing apparatus

Details Testing apparatus Testing apparatus

2006-10-10

2006-10-10

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07119547

ABSTRACT:
A testing apparatus includes a first power supply unit and first and second coaxial cables. The first power supply supplies current to a device under test. The first coaxial cable includes a first internal conductor and a first external conductor. The second coaxial cable includes a second internal conductor and a second external conductor. The first internal conductor and the second external conductor conducts current from the first power supply unit to the device under test. The second internal conductor and the first external conductor conducts current from the device under test to the first power supply unit.

REFERENCES:
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patent: 5014012 (1991-05-01), Kuboyama et al.
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patent: 6275023 (2001-08-01), Oosaki et al.
patent: 5-69690 (1993-09-01), None
patent: 6-342033 (1994-12-01), None
Patent Abstracts of Japan, Publication No.: 06-342033, Publication Date: Dec. 13, 1994, 2 pages.
PCT International Search Report for PCT Application No.: PCT/JP2005/001934 mailed on May 24, 2005, 6 pages.

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