Testing and removal of redundancies in VLSI circuits with non-bo

Details Testing and removal of redundancies in VLSI circuits with non-bo Testing and removal of redundancies in VLSI circuits with non-bo

1995-05-01

1997-08-12

Teska, Kevin J.

Boots, shoes, and leggings

364489, 364578, 371 271, G06F 1750

Patent

active

056572409

ABSTRACT:
Techniques for the generation of tests for detecting specified faults in circuits that include non-Boolean components and for identifying these undetectable faults that are logically redundant. The main features are: (1) only one Boolean variable is used to represent the value on a signal and all signals assume only Boolean values during the test generation procedure, (2) function of non-Boolean components is separated into Boolean and non-Boolean states, and energy functions are derived only for the Boolean state, and (3) non-Boolean states are implicitly considered in the energy minimization procedure.

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