Testing and diagnostic mechanism

Details Testing and diagnostic mechanism Testing and diagnostic mechanism

1997-09-17

1998-10-20

Beausoliel, Jr., Robert W.

Excavating

395290, G06F 1100

Patent

active

058257845

ABSTRACT:
A testing and diagnostic mechanism includes an external bus master allows access of virtually all internal registers on an integrated circuit, and allows the on-chip SRAM/DRAM controllers to access external memory.

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"An Introduction to Thumb" Advanced RISC Machines Ltd. (ARM), Mar. 1995, pp. 9-14.

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