Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration
Reexamination Certificate
2007-07-24
2007-07-24
Hirshfeld, Andrew H. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Calibration
C324S130000
Reexamination Certificate
active
10968615
ABSTRACT:
A testing device for determines values of various electrical variables associated with a device within a process system. The testing device provides bi-directional electrical communication with a device to be monitored and automatically provides a connection configuration between a processing unit and a set of input/output ports. The connection configuration governs a bi-directional flow of electrical signals between the processing unit and the device to be monitored. The processing unit outputs a test signal and a configuration control signal to the input/output port control circuitry. The input/output port control circuitry, in response to received test and configuration control signals, automatically provides a connection configuration to direct the test signal to the device to be monitored and to direct a return signal, the return signal being generated by the monitored device in response to the test signal, to the processing unit. The processing unit, based upon the connection configuration of the input/output port control circuitry, measures an electrical characteristic of the return signal and determines at least two electrical variables associated with the monitored device based upon the measured electrical characteristic of the return signal generated by the monitored device.
REFERENCES:
patent: 4853613 (1989-08-01), Sequeira et al.
patent: 5703489 (1997-12-01), Kuroe
patent: 6421624 (2002-07-01), Nakayama et al.
patent: 6671222 (2003-12-01), Wilson et al.
patent: 6958598 (2005-10-01), Xu
patent: 6990423 (2006-01-01), Brown et al.
patent: 2003/0115517 (2003-06-01), Rutten
Allen, Jr. Gerald T.
Clarridge Ronald P.
Basch & Nickerson LLP
Hirshfeld Andrew H.
Nguyen Hoai-An D.
Nickerson Michael J.
LandOfFree
Testing and calibration device with diagnostics does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Testing and calibration device with diagnostics, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing and calibration device with diagnostics will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3773118