Testing analog circuits using sigma-delta modulators

Details Testing analog circuits using sigma-delta modulators Testing analog circuits using sigma-delta modulators

1997-05-21

2000-10-17

Wachsman, Hal

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

702117, 702120, 702126, 324 731, 714 30, 714733, G01R 313167

Patent

active

061345059

ABSTRACT:
An integrated circuit device has an analog block connected to a sigma-delta modulator. Analog signals from internal nodes in the analog block are fed to the sigma-delta modulator. The sigma-delta modulator produces digital representations of the analog signals. The digital representations are forwarded to a processor for analysis of the internal node signal. The above structure may be integrated within the framework of existing digital test structures to form a built-in self-test scheme.

REFERENCES:
patent: 5226001 (1993-07-01), Garverick
patent: 5345409 (1994-09-01), McGrath et al.
patent: 5610826 (1997-03-01), Whetsel
patent: 5627536 (1997-05-01), Ramirez
patent: 5677845 (1997-10-01), Staver et al.

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