Testing an inductive load of a device using a modulated signal

Details Testing an inductive load of a device using a modulated signal Testing an inductive load of a device using a modulated signal

2011-06-07

2011-06-07

He, Amy (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S522000

Reexamination Certificate

active

07956619

ABSTRACT:
A device has built-in inductive load testing capabilities. The device includes a device housing, an inductive load disposed within the device housing; and test circuitry disposed within the device housing. The test circuitry is constructed and arranged to effectuate application of a modulated test signal to the inductive load, and obtain a result signal in response to the application of the modulated test signal to the inductive load. The test circuitry is further constructed and arranged to generate an output signal indicating that the inductive load is in one of (i) a shorted inductive load state, (ii) a normal inductive load state, and (iii) an abnormally high inductive load state, based on the result signal. Such test circuitry is well-suited for testing a variety of devices having inductors/coils which are susceptible to defects (e.g., a solenoid, a motor winding, various actuator components, etc.).

REFERENCES:
patent: 5384539 (1995-01-01), Morbe et al.
patent: 5532601 (1996-07-01), Weir et al.
patent: 5552712 (1996-09-01), Weir et al.
patent: 5914830 (1999-06-01), Kadlec et al.
patent: 6076391 (2000-06-01), Broch
patent: 6822560 (2004-11-01), Geber et al.

Affiliated with

Also associated with

Rating

Testing an inductive load of a device using a modulated signal does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing an inductive load of a device using a modulated signal, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing an inductive load of a device using a modulated signal will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2744512