Testing a sequential circuit

Details Testing a sequential circuit Testing a sequential circuit

1991-11-20

1996-12-31

Beausoliel, Jr., Robert W.

Excavating

371 221, H04B 1700

Patent

active

055901352

ABSTRACT:
A method for testing a sequential circuit by applying a number of test vectors to the primary inputs of the sequential circuit between each application of a clock circuit. Once the sequential circuit enters a state and that state is a necessary condition for detecting various faults, test vectors are applied to the primary inputs of the sequential circuit, which vectors are designed to propagate all fault effects that can be propagated at that state of the circuit. Once those vectors have been applied, a state-advancing vector is applied immediately before the application of the clock. The state-advancing vector is designed to condition the circuit to allow more fault effects to be propagated to the primary outputs, and to propagate fault effects into the storage elements of the circuit.

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patent: 5230001 (1993-07-01), Chandra et al.
"SCIRTSS: A Search System for Sequential Circuit Test Sequences" by Hill et al. IEEE pp. 490-502, May 1977.
"A Random and an Algorithmic Technique for Fault Detection Test Generation for Sequential Circuits" by Breuer, IEEE, Nov. 1971, pp. 149-158.
"Automatic Test Generation and Test Verification of Digital Systems" by Verma et al Burroughs Corp. IEEE, Sep. 1974 pp. 1364-1370.

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