Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Patent
1998-03-02
2000-05-16
Callahan, Timothy P.
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
702 66, G01R 3126
Patent
active
060649488
ABSTRACT:
A tester for use with a device under test includes a processor, a signal timing editor to create representations of signal waveforms and associated times, and a test program executable on the processor that schedules events based on information from the signal timing editor. The test program schedules different delays for the events to compensate for variations in time delays between different signals coupled to the device under test.
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Hunter Paul R.
Lawrence Archer R.
Little Jack C.
West Michael S.
Callahan Timothy P.
Nguyen Linh
Tanisys Technology, Inc.
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