Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-10-18
2005-10-18
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S073100, C324S1540PB, C714S724000
Reexamination Certificate
active
06956395
ABSTRACT:
A tester comprising a reference clock generating section for generating a reference clock having a first frequency, a first test rate generating section for generating a first test rate clock having a frequency which is about an integral multiple of the first frequency, a second test rate generating section for generating a second test rate clock having a frequency which is about an integral multiple of the first frequency and different from the frequency of the first test rate clock, a first driver section for supplying a test pattern to an electronic device according to the first test rate clock, and a second deriver section for supplying the test pattern to the electronic device according to the second test rate clock.
REFERENCES:
patent: 5703489 (1997-12-01), Kuroe
patent: 5710744 (1998-01-01), Suda
patent: 6255839 (2001-07-01), Hashimoto
patent: 6404220 (2002-06-01), Hashimoto
patent: 2001/0028243 (2001-10-01), Niratsuka
patent: 2-32078 (1990-02-01), None
NN81081677 “Combined multi corner testing with time and or voltage modulation” Aug. 1981, US. IBM technical disclosure bulletin, vol. 24, Issue No. 3, p. No. 1677-1679.
NN960971 “Mehanism for scan-based test application at high-speed” Sep. 1996, US. IBM technical disclosure bulletin, vol. 39, Issue No. 9, p. No. 71-78.
NA8911400 “Performance monotoring of VLSI devices” Nov. 1989, US. IBM technical disclosure bulletin, vol. 32, Issue No. 6A, p. No. 400-404.
International Search Report dated Apr. 30, 2003 (3 pgs.).
Patent Abstracts of Japan, Publication No. 11-014714 dated Jan. 22, 1999, 1 pg.
Patent Abstracts of Japan, Publication No. 2001-201533 dated Jul. 27, 2001, 1 pg.
Patent Abstracts of Japan, Publication No. 2000-221248 dated Aug. 11, 2000, 1 pg.
Patent Abstracts of Japan, Publication No. 09-026467 dated Jan. 28, 1997, 1 pg.
Patent Abstracts of Japan, Publication No. 03-195978 dated Aug. 27, 1991, 1 pg.
Patent Abstracts of Japan, Publication No. 2001-244923 dated Sep. 7, 2001, 1 pg.
Oshima Hideyuki
Tsuruki Yasutaka
Advantest Corporation
Osha & Liang LLP
Patel Paresh
LandOfFree
Tester for testing an electronic device using oscillator and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tester for testing an electronic device using oscillator and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tester for testing an electronic device using oscillator and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3472383