Tester architecture for testing semiconductor integrated...

Details Tester architecture for testing semiconductor integrated... Tester architecture for testing semiconductor integrated...

2005-10-18

2005-10-18

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

06956394

ABSTRACT:
A modular tester architecture allows end-users to mix-and-match scan chain modules and clock driver modules. Modules are interconnected via a synchronization bus allowing the test modules to synchronize with each other so that each can perform its portion of the overall test at the proper time in relation to the testing performed by other modules. The modules can include a BIST driver module, a data acquisition module, networking interface modules, a controller module, a current measurement module, and a DC parametrics module, among others.

REFERENCES:
patent: 5396170 (1995-03-01), D'Souza et al.
patent: 5929650 (1999-07-01), Pappert et al.
patent: 6331770 (2001-12-01), Sugamori
patent: 6754234 (2004-06-01), Wiesner et al.
patent: 6765836 (2004-07-01), Menczigar

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