Tester and a method for testing an integrated circuit

Details Tester and a method for testing an integrated circuit Tester and a method for testing an integrated circuit

2011-08-30

2011-08-30

Nguyen, Vinh P (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

08008935

ABSTRACT:
A method for testing an integrated circuit, that includes: (a) providing a first signal to a first path that starts within the integrated circuit and ends at a first memory element that is followed by a first IO pad, and providing a second signal to a second path that starts within the integrated circuit and ends at a second memory element that is followed by a second IO pad; (b) comparing between a first test result and a second test result, wherein the first test result represents a state of the first memory element sampled a predefined period after a provision of the first signal and the second test result represents a state of the second memory element sampled a predefined period after a provision of the second signal; (c) altering the predefined period; and (d) repeating the stages of providing, comparing and altering until detecting a time difference between a first path propagation period and a second path propagation period.

REFERENCES:
patent: 6384655 (2002-05-01), Mullarkey
patent: 7412343 (2008-08-01), Stroud et al.
patent: 2005/0111537 (2005-05-01), Sunter et al.

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