Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
1997-07-18
2002-02-19
Metjahic, Safet (Department: 2858)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
C324S754090, C324S761010
Reexamination Certificate
active
06348789
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Technical Field of the Invention
The present invention relates to a testboard for an IC tester and, in particular, to a testboard for an IC tester which connects an IC tester and an auto-handler.
2. Background Art
Testboards for IC testers lie between a device
16
being tested and a pin card
3
, comprise a base unit
1
and a DUT unit
2
as shown in
FIGS. 4-6
and are used to connect an IC tester and an auto-handler.
FIGS. 4A and 4B
are structural diagrams of the conventional art,
FIG. 5
is a perspective view of the conventional art, and
FIG. 6
is a diagram showing a view of the conventional art as seen from the direction of arrow VI of FIG.
5
.
In
FIGS. 4A and 4B
, base unit
1
comprises base board
5
on which first connector
6
is mounted, and cable harness
8
which has a second connector
7
and a third connector
9
at respective ends.
Pogo pin
4
is mounted on pin card
3
and base board
5
is connected to pin card
3
by pressing (as indicated by the arrow E in the figure) pogo pin
4
into a pogo pin connector (omitted from the figure) which is provided on the lower surface of the base board
5
. First connector
6
is mounted on base board
5
, and first connector
6
engages second connector
7
of cable harness
8
.
On the other hand, DUT unit
2
comprises connector card
11
on which fourth connector
10
is mounted, socket board
14
on which IC socket
15
is mounted, and cable
13
which is connected between connector card
11
and socket board
14
. As indicated by the numbers
12
in
FIG. 4A
, one end of cable
13
which is a component of DUT unit
2
is connected to connector
11
and the other end is connected to socket board
14
.
By means of this structure, it is possible to exchange DUT unit
2
so as to correspond with the different varieties of device
16
to be measured, by separating the base unit
1
and the DUT unit
2
between the third connector
9
and the fourth connector
10
(as indicated by the arrow C in FIG.
4
B).
In addition, it is possible to conduct maintenance on pin card
3
and first connector
6
by means of separating pin card
3
and base unit
1
between pogo pin
4
and pogo pin connector (omitted from the Figure) (at the position indicated by the arrow D in FIG.
4
B).
Furthermore, by means of using cable
13
which is a component of DUT
2
, it is possible to change the signal destination, and thereby obtain correspondence for a variety of different devices
16
being tested.
However, the above-mentioned conventional testboard for an IC tester has, for example, the following problems.
(1) The conventional DUT unit
2
comprises connector card
11
on which fourth connector
10
is mounted, socket board
14
on which IC socket
15
is mounted, and cable
13
which is connected to connector card
11
and socket board
14
by means of solder. The unit modulated in this way is housed in the box
17
as shown in FIG.
5
and
FIG. 6
, and thereby the DUT unit
2
is constructed.
Consequently, the DUT unit
2
is large, heavy and difficult to construct, as a result, separation and exchange is not easy, and, for example, separation and exchange require many people.
(2) As shown in FIG.
4
B and
FIG. 6
, first connector
6
is mounted on base board
5
which extends over the whole of base unit
1
. Therefore, when carrying out maintenance of the base unit
1
, exchange of the first connector
6
which is mounted on this kind of large base board
5
requires time and effort and is not simple.
(3) The connection of connector card
11
with socket board
14
which is a component of DUT unit
2
is by means of cable
13
which is connected at both ends by means of solder, and, in addition, the connection of base board
5
which is a component of base unit
1
with pin card
3
is conducted by means of pogo pin
4
(FIG.
4
and FIG.
6
). Consequently, in the signal system, there are a large number of connection points like pogo pin
4
and solder connection
12
, and it is difficult to realize, in particular, high speed transmission of high frequency signals. As a result, the reliability and transmittability of high frequencies is reduced.
(4) In order to obtain correspondence with a variety of different devices
16
being tested, it is necessary to change the arrangement of connecting signals.
DISCLOSURE OF THE INVENTION
An object of the present invention is the provision of a testboard for an IC tester for which it is simple to separate and exchange the DUT unit in accordance with different devices being tested, the maintainability of the base unit is improved, the reliability and transmittability of high frequency signals at connection points are improved, and, in addition, which uses a cable harness for which the arrangement of connecting signal can be changed.
In order to solve the above-mentioned problems, as shown in
FIGS. 1 through 3
, the present invention is a testboard for an IC tester which comprises a base unit and a DUT unit, and lies between the device being tested and a pin card.
In the present invention, the above-mentioned base unit
21
of the testboard for an IC tester comprises sixth connector
24
which engages fifth connector
23
which is mounted on pin card
3
; base card
25
on which sixth connector
24
is mounted and which is divided into sections, one for each sixth connector
24
; and cable harness
27
which comprises seventh connector
26
and eighth connector
28
at respective ends, and for which the connection destination in which seventh connector
26
engages sixth connector
24
which is mounted on the above-mentioned base card
25
is changeable.
The above-mentioned DUT unit
22
comprises socket board
14
on which ninth connector
29
which engages eighth connector
28
of cable harness
27
is mounted; and which comprises IC socket
15
.
By means of the present invention, since the DUT unit
22
comprises only socket board
14
and does not have a cable arrangement, the DUT unit
22
can be small and light weight, construction is easy, separation and exchange of the DUT unit is simple, and by means of a socket board
14
having a different pattern, it is possible to achieve correspondence for a variety of different devices
16
being measured.
In addition, since sixth connector
24
is mounted on base card
25
which is divided, the maintainability of base unit
21
is improved, and pogo pins and solder connections
12
are unnecessary, therefore, connection points are reduced and the reliability and transmittability of high frequency signals is improved. Furthermore, since connections are made via cable harness
27
for which it is possible to change connection destinations between socket board
14
and pin card
3
, it is possible to change the arrangement of connecting signals.
REFERENCES:
patent: 3274534 (1966-09-01), Shortridge
patent: 4517512 (1985-05-01), Petrich et al.
patent: 4996478 (1991-02-01), Pope
patent: 5055777 (1991-10-01), Bonelli et al.
patent: 5126657 (1992-06-01), Nelson
patent: 5247246 (1993-09-01), Van Loan et al.
patent: 04025777 (1992-01-01), None
patent: 4-21881 (1992-02-01), None
patent: 04169874 (1992-06-01), None
patent: 4-289467 (1992-10-01), None
patent: 06267629 (1994-09-01), None
patent: 07012889 (1995-01-01), None
patent: 7-92232 (1995-07-01), None
patent: 8-129048 (1996-05-01), None
patent: 10185990 (1998-07-01), None
patent: 11083934 (1999-03-01), None
Ando Electric Co. Ltd.
Darby & Darby
Hollington Jermele
Metjahic Safet
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