Testable time delay

Electrical pulse counters – pulse dividers – or shift registers: c – Systems – Identifying or correcting improper counter operation

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Details

377 19, 377107, 377 39, 371 61, 371 62, G06F 1100, G06M 302

Patent

active

045190909

ABSTRACT:
A testable time delay apparatus includes means for testing component operation during any stage of system function and means for continuously monitoring and testing component functions. The device is particularly useful in critical process control applications such as in a nuclear reactor control system.

REFERENCES:
patent: 3845282 (1974-10-01), Mattson
patent: 3934131 (1976-01-01), Perschy
patent: 4082218 (1978-04-01), Paulinski
patent: 4144448 (1979-03-01), Piscidtta et al.
patent: 4223213 (1980-09-01), Bibbee et al.
patent: 4336448 (1982-06-01), Shipp et al.
patent: 4373201 (1983-02-01), Bohan
patent: 4392226 (1983-07-01), Cook

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