Testable non-volatile memory device

Details Testable non-volatile memory device Testable non-volatile memory device

1996-07-19

1999-04-20

Elmore, Reba I.

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

36447801, 36447803, 209571, 209573, G05B 1902

Patent

active

058954430

ABSTRACT:
The present invention provides test flow assurance using memory imprinting. The device being tested includes a nonvolatile memory portion for storing an information imprint in a present test status field. The imprint indicates the bin category to which the device is to be directed according to the results of a test sequence. During the start of a test in the test flow, the present test status field is read to determine whether the device has already passed through the present test. If so, the device is not retested according to that test step, and it is binned out according to the imprinted information. If the imprint indicates that the device has not already passed through the present test, then the present test sequence is performed, the device programmed with its imprint, and binned out accordingly. If, during the present test sequence, the imprint indicates that the device did not pass through a previous test sequence as it should have, then the device is binned out as a failure because it was not properly processed. Alternatively, the device may be binned out as requiring testing according to the prior tests that the part has not undergone.

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