Testable, fault-tolerant power interface circuit for normally de

Induced nuclear reactions: processes – systems – and elements – Testing – sensing – measuring – or detecting a fission reactor... – By particular instrumentation circuitry

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

376215, 324415, 371 20, 371 22, 371 36, G21C 1700

Patent

active

046831053

ABSTRACT:
A power interface circuit for normally deenergized loads includes the capability to test the operation and connections thereof without any possibility of accidental activation of the load. Three input signals may be received by the power interface circuit which supplies power to a load if two out of three of the input signals indicates activation of the load. A normally closed switch which ordinarily provides power directly to the voter is opened during testing so that the voter is supplied with a reduced power that is insufficient to activate the load. The normally closed switch is closed if any of the input signals indicate activation of the load. Current sensors are included in the power interface circuit to detect all possible logic combinations for activating the load and to detect the operation of the normally closed switch.

REFERENCES:
patent: 3437556 (1969-04-01), Bevilaqua et al.
patent: 3967257 (1976-06-01), Hager
patent: 4184514 (1980-01-01), Ryan et al.
patent: 4200864 (1980-04-01), Gillet et al.
patent: 4272725 (1981-06-01), Weiner et al.
patent: 4317412 (1982-03-01), Bolcavage et al.
patent: 4320508 (1982-03-01), Takezoe
patent: 4422140 (1983-12-01), Keats
patent: 4427620 (1984-01-01), Cook
patent: 4434132 (1984-02-01), Cook
patent: 4562035 (1985-12-01), Plaige
patent: 4587077 (1986-05-01), Bessedine

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Testable, fault-tolerant power interface circuit for normally de does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testable, fault-tolerant power interface circuit for normally de, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testable, fault-tolerant power interface circuit for normally de will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2034076

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.