Testable circuit configuration having a plurality of identical c

Details Testable circuit configuration having a plurality of identical c Testable circuit configuration having a plurality of identical c

1996-09-30

1998-09-15

Beausoliel, Jr., Robert W.

Excavating

365201, G01R 3128

Patent

active

058090401

ABSTRACT:
A circuit configuration includes a plurality of identical circuit blocks, at least one input terminal, at least one output terminal, a comparison device and a controlled switching device. The controlled switching device is to be connected to the identical circuit blocks, to the comparison device, to the at least one input terminal and to the at least one output terminal for coupling the identical circuit blocks to each other. The controlled switching device couples the at least one input terminal to the input side of the identical circuit blocks for supplying a path for input test patterns from the at least one input terminal to the identical circuit blocks. The controlled switching device couples the output side of the identical circuit blocks to the comparison device for supplying a path for output test patterns from each of the identical circuit blocks to the comparison device. The comparison device compares the output test patterns from each of the identical circuit blocks, and the comparison device generates an error signal after detecting incompatible test output patterns for external processing. The controlled switching device also couples the comparison device to the at least one output terminal.

REFERENCES:
patent: 4357703 (1982-11-01), Van Brunt
patent: 4534028 (1985-08-01), Trischler
patent: 4752929 (1988-06-01), Kantz et al.
patent: 4768194 (1988-08-01), Fuchs
patent: 4918379 (1990-04-01), Jongepier
patent: 5017810 (1991-05-01), Nakano et al.
patent: 5155432 (1992-10-01), Mahoney
patent: 5260949 (1993-11-01), Hashizume et al.
patent: 5294882 (1994-03-01), Tanaka
patent: 5459738 (1995-10-01), Watari

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