1996-10-18
1998-07-14
Beausoliel, Jr., Robert W.
Excavating
371 2234, G01R 3128
Patent
active
057815593
ABSTRACT:
A testable circuit comprises a signal path having a time-dependent response behavior (for example, a high-pass filter behavior). The signal path is tested for faults. To this end, the circuit is switched to a test mode in which the signal path is isolated from other signal paths. Subsequently, a test signal containing a signal transition is applied to the input of the signal path and it is tested whether the signal on the output of the signal path at any instant exceeds a threshold level during a predetermined time interval after the transition. The result is loaded into a register and read from the circuit.
REFERENCES:
patent: 5404358 (1995-04-01), Russell
patent: 5565801 (1996-10-01), Ernst
patent: 5581176 (1996-12-01), Lee
patent: 5610530 (1997-03-01), Whetsel
patent: 5610826 (1997-03-01), Whetsel
De Jong Franciscus G. M.
de Wilde Johannes
Muris Mathias N. M.
Schuttert Rodger F.
Beausoliel, Jr. Robert W.
Iqbal Nadeem
U.S. Philips Corporation
Wieghaus Brian J.
LandOfFree
Testable circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Testable circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testable circuit will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1890566