Testability technique for phase interpolators

Details Testability technique for phase interpolators Testability technique for phase interpolators

2011-03-15

2011-03-15

Payne, David C. (Department: 2611)

Pulse or digital communications

Testing

Phase error or phase jitter

C375S224000, C375S373000, C375S375000, C375S376000, C370S229000, C370S230000, C370S231000, C370S232000, C370S233000, C370S234000, C370S235000, C327S141000, C327S175000

Reexamination Certificate

active

07907661

ABSTRACT:
A method and circuit for testing phase interpolators is provided. The method performs a sweep over a phase interpolator delay range and detects if the phase interpolators experience an unacceptably large non-linearity which leads to inaccurate clock timing. The testing circuit implementing this technique uses a phase detector to detect a fault, and in one embodiment, an additional phase interpolator is added as well.

REFERENCES:
patent: 2004/0066873 (2004-04-01), Cho et al.
patent: 2006/0181319 (2006-08-01), Zhang
patent: 2009/0122849 (2009-05-01), Provost

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