Testability system

Details Testability system Testability system

1984-06-27

1988-01-19

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 371 27, G01R 1512, G01R 3122, G01R 3128

Patent

active

047206721

ABSTRACT:
A system for enhancing the testability of functional electronic circuitry may be provided as a separate device or incorporated in circuits and includes serial or parallel control point input data capability applied through tri-statable output drivers to input nodes of circuit elements of functional circuitry without interference with such circuitry during non-testing situations and receivers for observing resultant logic states at output nodes of functional circuitry being tested.

REFERENCES:
patent: 3919637 (1975-11-01), Earp
Labare et al.; "Tester for Data Processor"; IBM Technical Disclosure
Bulletin; vol. 18, No. 1; Jun. 1975; pp. 184-185.

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