Testability circuits for logic arrays

Details Testability circuits for logic arrays Testability circuits for logic arrays

1993-11-30

1996-06-18

Voeltz, Emanuel T.

Excavating

371 223, 371 226, 326 16, 326 40, 365200, 3241581, G11C 1140, G01R 3128

Patent

active

055286003

ABSTRACT:
A circuit for providing 100% observability and controllability of inputs and outputs of any function circuit module in an array of function circuit modules includes circuitry for placing a test data bit into a selected one of any of the function circuit modules, and circuitry for reading the output of a selected one of any of the function circuit modules.

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