Test vector generation system

Details Test vector generation system Test vector generation system

1989-05-25

1991-07-02

Atkinson, Charles E.

Excavating

371 151, G01R 3128

Patent

active

050291718

ABSTRACT:
A test pattern data generator 16 may be made to create and generate all of the unique test vectors associated with it. These test vectors may have an arbitrarily selected programmable length 26(a-d) and may be generated in an arbitrarily selected programmable quantity 28(a-d). Furthermore, a unique test vector may be generated in a number of clock periods approximately equal to the number of shift registers (156, 158) contained in a scan or application interface unit 20. All these features are accomplished by initially placing a seed initialization value in the test pattern generator 16 and having the test pattern data generator cycle through a number of states, the second state of the test pattern generation being inputted to a seed register 12. The contents of the seed register 12 are used as the seed initialization value for the second test vector to be generated by the generator 16. This process is continued until all of the unique test vectors have been created. This invention also allows for test partitioning whereby the contents of the seed register 12 may be stored for a period of time and a complete test, entailing the creation and generation of a complete set of unique test vectors, may be partitioned in time, into a series of tests containing smaller numbers of these unique test vectors.

REFERENCES:
patent: 4639919 (1987-01-01), Chang et al.
patent: 4688223 (1987-08-01), Motika et al.
patent: 4718065 (1988-01-01), Boyle et al.
patent: 4755969 (1988-07-01), Pappas
patent: 4771429 (1988-09-01), Davis et al.
patent: 4779273 (1988-10-01), Beucler et al.
patent: 4862399 (1989-08-01), Freeman

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