Test unit for a logic circuit analyzer

Details Test unit for a logic circuit analyzer Test unit for a logic circuit analyzer

1980-08-25

1983-06-28

Tokar, Michael J.

Electricity: measuring and testing

Plural, automatically sequential tests

324158F, G01R 1512

Patent

active

043908373

ABSTRACT:
A test unit for identifying output signals at test points of a logic circuit on an oscilloscope and being operable in a real time mode or a memory mode. In the real time mode, the oscilloscope is triggered by any selected one of several signals and, at this time, output signals sensed by test probes are displayed on the oscilloscope. In the memory mode, the output signals are written into a memory. In response to the selected one signal, the output signals written into the memory before or after the occurrence of the selected one signal can be selected for display on the oscilloscope.

REFERENCES:
patent: 3098219 (1963-07-01), Voigt et al.
patent: 3161827 (1964-12-01), Buisson
patent: 3370232 (1968-02-01), Wickersham
patent: 3602810 (1971-08-01), Nicolantonio
patent: 3750015 (1973-07-01), Sheter
patent: 3818339 (1974-06-01), Black
patent: 3831149 (1974-08-01), Job
patent: 3903471 (1975-09-01), Hirnga
patent: 3946310 (1976-03-01), Saper
patent: 4016492 (1977-04-01), Miller
patent: 4145651 (1979-03-01), Ripingill
patent: 4309657 (1982-01-01), Lockhart

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