Test tray positioning stopper mechanism for automatic handler

Details Test tray positioning stopper mechanism for automatic handler Test tray positioning stopper mechanism for automatic handler

1996-10-03

1999-10-26

Karlsen, Ernest

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324758, G01R 3102

Patent

active

059734930

ABSTRACT:
A mechanism for positioning IC devices to be tested aligned in a test tray of an automatic handler for an IC test system capable of reducing a time for transferring the test tray from a supply area to a test head area which has a plurality of test contactors and from a test head area to a discharge area is disclosed. The mechanism includes a stopper which determines the first stop position of the test tray when said test tray contacts with the outer surface of the test tray and the second stop position of the test tray when said stopper contacts with the end surface of a groove being provided with on its side portion of the test tray to receive and engage with the projection of the stopper. The distance between the adjacent test contactors is adjusted to be equal to two times or integer multiple of the distance between the adjacent IC devices to be tested aligned in the test tray and the distance between the first position and the second position is adjusted to be equal to the distance between the adjacent IC devices to be tested so that minimizing the index time for transferring the test tray becomes possible.

REFERENCES:
patent: 3844428 (1974-10-01), Olsen
patent: 4114752 (1978-09-01), Schiek
patent: 4371075 (1983-02-01), Erlichman
patent: 4453807 (1984-06-01), Faulkner et al.
patent: 4488633 (1984-12-01), Kampf
patent: 4516318 (1985-05-01), Kirschenman

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