Test timing program automatic generator

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324 731, 364579, 371 27, G01R 3126

Patent

active

054348056

ABSTRACT:
A test timing condition setting program generator for automatically generating a test timing condition program. Waveforms indicating product inspection specifications are input using a waveform input editor, a timing value being attached to each waveform. Using the timing values, an intermediate data generation unit generates intermediate data. Though format of the intermediate data is converted into a test program format acceptable to a particular semiconductor tester by a translator, thereby automatically generating a source program of a test timing condition setting program.

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