Test table for measuring lateral forces and displacements

Measuring and testing – Hardness – By penetrator or indentor

Reexamination Certificate

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Details

C033S568000

Reexamination Certificate

active

07316155

ABSTRACT:
A test table for measuring lateral forces and displacements while simultaneously applying, if necessary, normal forces, particularly in nanoidenters and in scratch and wear testers. The test table is mounted in a manner that enables it to be laterally displaced, and the lateral force and displacement can be determined by means of a measured-value acquisition. The test table is fixed between at least two vertically upright leaf springs, which can be laterally deflected in the direction of the lateral (horizontal) motion of the test table to be effected.

REFERENCES:
patent: 2573286 (1951-10-01), Baker et al.
patent: 3201980 (1965-08-01), Webb
patent: 3982738 (1976-09-01), Meier et al.
patent: 4157818 (1979-06-01), Key
patent: 4635887 (1987-01-01), Hall et al.
patent: 4925139 (1990-05-01), McCord
patent: 5051594 (1991-09-01), Tsuda et al.
patent: 5067346 (1991-11-01), Field
patent: 5232062 (1993-08-01), Neuman
patent: 5343748 (1994-09-01), Mozgowiec et al.
patent: 5360974 (1994-11-01), Hammond et al.
patent: 5523941 (1996-06-01), Burton et al.
patent: 5854487 (1998-12-01), Braunstein et al.
patent: 5999887 (1999-12-01), Giannakopoulos et al.
patent: 6246052 (2001-06-01), Cleveland et al.
patent: 6520004 (2003-02-01), Lin
patent: WO 99 46576 (1999-09-01), None
patent: WO 02 16907 (2002-02-01), None
“Microscratch and Load Relaxation Tests for Ultra-Thin Films”—Wu T. W. Journal of Materials Research, New York, NY, U.S., vol. 6, No. 2, pp. 407-426 Feb. 1991.
International Search Report.
“Microscratch and Load Relaxation Tests for Ultra-Thin Films”—Wu T. W. Journal of Materials Research, New York, NY, U.S., vol. 6, No. 2, pp. 407-426 Feb. 1991, enclosed May 12, 2006.
“Microscratch and Load Relaxation Tests for Ultra-Thin Films”—Wu T. W. Journal of Materials Research, New York, NY, U.S., vol. 6, No. 2, pp 407-426 Feb. 1991, (to follow).

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