Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-08-22
2006-08-22
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C438S016000
Reexamination Certificate
active
07096140
ABSTRACT:
A test system for an integrated circuit includes a grouping module grouping measurement points on basis of values of the quiescent supply current and setting measurement point groups; an average value setting module setting a weighted average value minimizes the sum of dispersion of the quiescent supply current; a calculating module calculating a maximum estimated value of dispersion of the quiescent supply current on the basis of the weighted average value; and a judgment module judging whether the integrated circuit passes or fails the judgment specification.
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Official Action as received from the Japanese Patent Office, issued on Mar. 28, 2006 regarding the counterpart Japanese Patent Application No. 2003-371046.
Nozuyama Yasuyuki
Shidou Mahito
DLA Piper Rudnick Gray Cary US LLP
Kabushiki Kaisha Toshiba
Raymond Edward
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