Test system for testing the quality of semiconductor parts and h

Details Test system for testing the quality of semiconductor parts and h Test system for testing the quality of semiconductor parts and h

1997-09-08

1999-07-20

Shah, Kamini

Data processing: measuring, calibrating, or testing

Testing system

Of mechanical system

702125, 36447801, 364488, 36446828, G01R 3100

Patent

active

059267747

ABSTRACT:
A test system testing whether test objects, such as semiconductor parts, are good or bad collects operation status data to increase the operation rate of the tester testing the test objects and the handlers handling the test objects. The relay device to which the handlers and the tester are connected, collect operation status data from them, makes a count of test objects, and sends the data and the count to the server device and the storage device. Based on the collected data and count, the server device calculates the operation time of the handlers and the tester necessary or testing a unit of test objects. The next time the test is made, the handler references the operation time to search for the optimum combination of the handlers and the tester.

REFERENCES:
patent: 5355320 (1994-10-01), Erjavic et al.

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