Test system for laser diode far-field pattern measurement

Details Test system for laser diode far-field pattern measurement Test system for laser diode far-field pattern measurement

2005-07-26

2005-07-26

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

Lamp beam direction or pattern

Reexamination Certificate

active

06922232

ABSTRACT:
A test system for positioning and measuring the far-field pattern of a laser diode under test (LDUT) using a single objective lens and two relay lenses. Positioning is achieved by passing light from the LDUT through a video microscope formed by the objective lens and a first relay lens, which focuses the light onto an image plane for capture by a first camera. Far-field pattern measurement is performed by reflecting a portion of the focused light through a second relay lens, which collimates the light and directs the unfocused light onto an infinity image plane, where it is captured by a second video camera. Angular orientation is achieved using a laser collimator that reflects beam energy from a datum plane of the LDUT. The reflected beam energy forms a point image at the infinity image plane that is used to determine and/or adjust the angular orientation of the LDUT.

REFERENCES:
patent: 63195538 (1988-08-01), None

Affiliated with

Also associated with

Rating

Test system for laser diode far-field pattern measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test system for laser diode far-field pattern measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test system for laser diode far-field pattern measurement will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3367390