Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2007-09-04
2007-09-04
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
Reexamination Certificate
active
10969426
ABSTRACT:
Device characterization performed with a test system including a fixture and multiple frequency dependent test boards. In one embodiment, testing is performed with multiple sets of input and output test boards wherein each set is frequency dependent at different frequencies. In some examples, the test board includes an impedance transformer that is a quarter wave length of the fundamental frequency (f0) of a frequency of which the board is dependent. In some examples, S-parameters and load pull measurements are obtained for the device under test with the test boards at different frequencies.
REFERENCES:
patent: 4746861 (1988-05-01), Nesbitt
patent: 4963824 (1990-10-01), Hsieh et al.
patent: 5038100 (1991-08-01), Kushner et al.
patent: 5268637 (1993-12-01), Liken et al.
patent: 5506513 (1996-04-01), Bacher
patent: 5642056 (1997-06-01), Nakajima et al.
patent: 5894225 (1999-04-01), Coffin
patent: 5994894 (1999-11-01), Fujita
patent: 6414563 (2002-07-01), Tsironis
patent: 6558169 (2003-05-01), Figueroa et al.
patent: 6933736 (2005-08-01), Kobayashi et al.
patent: 2005/0014395 (2005-01-01), Fjelstad et al.
patent: 2006/0006859 (2006-01-01), Watanabe
“Transistor Test Fixture MT950 Series,” Maury Microwave, Precison Measurement Equipment, http://www.maurymw.com/products/RFDCS/LoadPull/atsprods/MT950—Series.A/MT950—SeriesA.htm, Sep. 2003, pp. 77-79.
“Adjustable Test Fixture Mainframes,” Inter-Continental Microwave, http://.icmicrowave.com/Adjustable—Mainframe—TF/Adjustable—Test—Mainframes.htm, Sep. 2003, 2 pgs.
Knappenberger William P.
Majerus Michael E.
Dolezal David G.
Freescale Semiconductor Inc.
Isla-Rodas Richard
LandOfFree
Test system for device characterization does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test system for device characterization, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test system for device characterization will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3787692