Test system for device and method thereof

Details Test system for device and method thereof Test system for device and method thereof

2006-04-25

2006-04-25

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07034558

ABSTRACT:
In one embodiment, a contactor (200) is provided. The contactor (200) comprises a device side (210), a test circuit board side (155), and a thickness (110). The device side (210) is in communication with at least three electrical contact points (140, 141, 142) of the device (170). The test circuit board side (155) includes a fourth electrical contact point (193) in electrical communication with the circuit board (150). The contactor (200) also includes a first electrical pathway (220) between the first electrical contact point (140) and the second electrical contact point (142). The first electrical pathway (220) bypasses the circuit board (150). The contactor (200) further includes a second electrical pathway (270) between the third electrical contact point (142) and the fourth electrical contact point (193).

REFERENCES:
patent: 4668041 (1987-05-01), La Komski et al.
patent: 5430614 (1995-07-01), Difrancesco
patent: 5471151 (1995-11-01), DiFrancesco
patent: 5506514 (1996-04-01), Difrancesco
patent: 5642055 (1997-06-01), Difrancesco
patent: 5929649 (1999-07-01), Cramer
patent: 6049217 (2000-04-01), Viswanath et al.
patent: 6384618 (2002-05-01), Pursel et al.

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