Electricity: measuring and testing – Magnetic – Magnetic information storage element testing
Patent
1979-05-23
1982-04-06
Strecker, Gerard R.
Electricity: measuring and testing
Magnetic
Magnetic information storage element testing
307471, G01R 3312, G01N 2782, H03K 522
Patent
active
043238440
ABSTRACT:
A system for testing magnetic tape comprising a pair of magnetic head assemblies positioned at a fixed length along the path of magnetic recording tape. A read-out signal of the first magnetic head is delayed by a delay circuit by time t=l/V, where l is the length between the first magnetic head and the second magnetic head, and V is the tape feeding speed. A logical AND circuit and a logical exclusive-OR circuit are provided for receiving the output of the delay circuit and the read-out signal of the second magnetic head. When the AND circuit provides an output signal, it is recognized that both the first and second magnetic heads have sensed a permanent defect. When the exclusive-OR circuit provides an output signal, it is recognized that either the first magnetic head or second magnetic head has sensed a temporary defect. Accordingly, both a permanent defect and a temporary defect are detected by running magnetic tape only once in a predetermined direction.
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patent: 2870430 (1959-01-01), Hancock
patent: 3466535 (1969-09-01), Sterns et al.
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patent: 4038596 (1977-07-01), Lee
patent: 4127813 (1978-11-01), Hiroshima et al.
patent: 4207534 (1980-06-01), Miille
Ratner Allan
Strecker Gerard R.
TDK Electronics Co. Ltd.
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