Test system and test structure for testing an integrated...

Details Test system and test structure for testing an integrated... Test system and test structure for testing an integrated...

2007-03-20

2007-03-20

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB, C714S734000

Reexamination Certificate

active

11013873

ABSTRACT:
One embodiment of the invention relates to a test structure for testing an integrated circuit with a tester unit that has one or more connecting lines to connect the integrated circuit, wherein a test signal and/or a supply voltage is applied to the integrated circuit for the purposes of testing, and an interference unit connected to at least one of the connecting lines which applies an interference signal to the connecting line to reduce the quality of the test signal and/or the quality of the supply voltage.

REFERENCES:
patent: 5574369 (1996-11-01), Hibbs
patent: 5883521 (1999-03-01), Nishikawa
patent: 6286117 (2001-09-01), Yun et al.
German Patent Office Examination Report dated Aug. 6, 2004.

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