Test system and process with a microcomputer at each test locati

Details Test system and process with a microcomputer at each test locati Test system and process with a microcomputer at each test locati

1999-05-11

2000-09-05

Metjahic, Safet

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3126

Patent

active

061148709

ABSTRACT:
An integrated circuit device test arrangement includes a plurality of microcomputers. Each of the microcomputers is interconnected directly through a separate test socket to a separate integrated circuit device that is inserted into the test socket. A device tester is called to the plurality of microcomputers for transmitting information between the device tester and the plurality of microcomputers. Each microcomputer contains instructions and data for performing a test routine on the associated integrated circuit device and transmitting selected results of the test routine to the tester.

REFERENCES:
patent: 5461310 (1995-10-01), Cheung et al.
patent: 5497079 (1996-03-01), Yamada et al.

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