Test system and method for reducing test signal loss for...

Details Test system and method for reducing test signal loss for... Test system and method for reducing test signal loss for...

2008-02-29

2010-02-16

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07663391

ABSTRACT:
An integrated circuit test system includes a probe card, a driver, a receiver, and a first switch. The driver is coupled to the probe card via a first signal line. The receiver is coupled to the probe card via a second signal line. The first switch is coupled between the probe card and the first signal line. After the driver outputs a test signal to a device under test via the first signal line, the first switch is turned off, and then the receiver reads the test signal via the second signal line. Thus, the test signal loss can be reduced.

REFERENCES:
patent: 6937040 (2005-08-01), Maeda et al.
patent: 6954079 (2005-10-01), Sugimoto et al.
patent: 2002/0084795 (2002-07-01), Cook et al.
patent: 2005/0110511 (2005-05-01), Gabara et al.
patent: 2006/0083861 (2006-04-01), Gedeon
patent: 2008/0017856 (2008-01-01), Fujino
patent: 2009/0085596 (2009-04-01), Ruf et al.

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