Test system and method for reduced index time

Details Test system and method for reduced index time Test system and method for reduced index time

2007-02-27

2007-02-27

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090, C324S756010

Reexamination Certificate

active

10767932

ABSTRACT:
A system for testing with an automated test equipment (ATE). The ATE includes a tester, an interface board connected to the tester, a first socket and a second socket of the interface board, a first manipulator arm connected to the tester, and a second manipulator arm connected to the tester. The first socket and the second socket are parallel-wired to the tester. The ATE also includes a switch connected to the tester and the interface board. The switch selectively effects communicative connection of the tester to either of the first socket or the second socket at each instant. During testing via one of the sockets, one of the manipulator arms moves post-test devices and replaces next devices for testing in the other of the sockets. After testing via one of the sockets is completed, the switch immediately connects the other socket and testing of next devices commences and continues for those devices. The system continuously repeats the movement and replacing of devices in each respective socket during testing of devices at the other socket. Index time for testing with the system is substantially negligible.

REFERENCES:
patent: 5650732 (1997-07-01), Sakai
patent: 6225798 (2001-05-01), Onishi et al.
patent: 6515470 (2003-02-01), Suzuki et al.
patent: 6831454 (2004-12-01), Bae et al.
patent: 6958617 (2005-10-01), Rhodes
patent: 2004/0143411 (2004-07-01), Wu
PCT Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, dated Jan. 20, 2006.

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