Test system and method for dynamic testing of a plurality of pac

Details Test system and method for dynamic testing of a plurality of pac Test system and method for dynamic testing of a plurality of pac

1994-09-15

1996-01-09

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 324500, 324765, 340653, G01R 3128

Patent

active

054831555

ABSTRACT:
A test system is provided for the dynamic testing at the same time of a plurality of packaged charge coupled device (CCD) image sensors in which the plurality of image sensors of the same sensor type can be tested under conditions including selectable signal levels of bias control signals and selected signal levels and pulse durations of clocked control signals appropriate to the type of CCD image sensor of the plurality of sensors under test. The test system provides selectably level-adjusted control signals, selector switch means for generating selectable clock signals having the level-adjusted signal levels, and a clock driver for amplifying the clocked control signals. The amplified control signals are directed to a common input terminal of an isolation network assembly, each of separate output terminals thereof connected to a corresponding input terminal of each one of the CCD image sensors to be tested. The test system is designed such that a sole remaining functioning CCD image sensor of the plurality of sensors can still be dynamically tested while all others of the plurality of CCD image sensors have experienced a catastrophic short-circuit condition at the corresponding clocked-signal input terminal.

REFERENCES:
patent: 5113134 (1992-05-01), Plus et al.

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