Data processing: measuring – calibrating – or testing – Testing system
Reexamination Certificate
2007-04-24
2007-04-24
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
C702S031000, C702S119000, C702S120000, C702S187000, C714S724000, C714S738000, C714S739000, C714S741000, C716S030000, C324S756010, C324S757020, C324S701000
Reexamination Certificate
active
11393379
ABSTRACT:
There is provided a test system that tests a device under test. The test system includes a test apparatus that tests the device under test on the basis of an event, and an added apparatus that is added between the device under test and the test apparatus when an interval to which a device output signal is changed is smaller than an interval capable of being processed by the test apparatus, and the added apparatus includes a signal input section that inputs the device output signal output from the device under test according to the device input signal, a change detecting section that detects whether the input device output signal has been changed or not, a change timing detecting section that detects the change timing for the device output signal, a storing section that sequentially stores the change timing and the signal value after the change for the device output signal as an output event, according to the fact that the device output signal has been changed, and a reading section that sequentially reads the output events from the storing section to input the events into the test apparatus.
REFERENCES:
patent: 6080203 (2000-06-01), Njinda et al.
patent: 6101622 (2000-08-01), Lesmeister
patent: 6158031 (2000-12-01), Mack et al.
patent: 6182858 (2001-02-01), Hartog
patent: 6347388 (2002-02-01), Hollander
patent: 6530054 (2003-03-01), Hollander
patent: 2002/0073375 (2002-06-01), Hollander
patent: 2003/0093737 (2003-05-01), Purtell et al.
patent: 2005/0039079 (2005-02-01), Higashi et al.
patent: 2006/0052965 (2006-03-01), Nodwell
patent: 8-278988 (1996-10-01), None
patent: 2001-67395 (2001-03-01), None
patent: 2001067395 (2001-03-01), None
Patent Abstracts of Japan, Publication No. 2001-067395, Publication Date: Mar. 16, 2001, 1 page.
Patent Abstracts of Japan, Publication No. 08-278988, Publication Date: Oct. 22, 1996, 1 page.
Sugamori Shigeru
Watanabe Yuya
Advantest Corporation
Osha-Liang LLP
Tsai Carol S. W.
LandOfFree
Test system, added apparatus, and test method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test system, added apparatus, and test method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test system, added apparatus, and test method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3778326