Test system

Details Test system Test system

2008-08-26

2010-12-07

Koval, Melissa J (Department: 2831)

Electricity: measuring and testing

For insulation fault of noncircuit elements

C315S129000, C324S403000, C362S249010

Reexamination Certificate

active

07847563

ABSTRACT:
A test system includes a front bezel of an electronic device and a test device. The front bezel includes a plurality of positions defined in the front bezel, a plurality of light emitting diodes (LEDs) located in the plurality of positions, and a female LED connector connected to the plurality of LEDs. The test device includes a male LED connector electrically connected to the female LED connector, and a programmable logic device (PLD) electrically connected to the male LED connector, and configured to control the LEDs to emit light in a sequence to determine if the plurality of LEDs are correctly located in the correct plurality of positions.

REFERENCES:
patent: 2007/0217209 (2007-09-01), Wong

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