Test system

Details Test system Test system

2007-07-03

2007-07-03

Lee, Michael G. (Department: 2876)

Registers

Coded record sensors

Testing

C235S441000, C235S446000, C235S487000, C235S380000

Reexamination Certificate

active

11498199

ABSTRACT:
A test system (1) has a test controller (2) and at least one probe (3). An ICC card (C) is inserted into a slot (8) of the probe (3), and a card-simulating interface (5) of the probe (3) is inserted in the slot (S) of the terminal (T) under test. The test controller (2) communicates bi-directionally with the terminal (T) and an external transaction processing system (B). Up to six data monitoring points (100to105) are possible, different numbers of points providing different modes of operation.

REFERENCES:
patent: 5577197 (1996-11-01), Beck
patent: 5585617 (1996-12-01), Ohbuchi et al.
patent: 6035357 (2000-03-01), Sakaki
patent: 6129271 (2000-10-01), Kubitz
patent: 6292909 (2001-09-01), Hare
patent: 6336590 (2002-01-01), Kubitz
patent: 6808113 (2004-10-01), Yamasaki
patent: 6988931 (2006-01-01), Martinet et al.
patent: 2004/0220575 (2004-11-01), Kubitz
patent: 2005/0145699 (2005-07-01), Zucker et al.
patent: 69191 (1996-08-01), None
patent: WO00/39684 (2000-07-01), None

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