Test structure embedded in a shipping and handling cover for...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location

Reexamination Certificate

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C324S530000

Reexamination Certificate

active

07068039

ABSTRACT:
A device for enabling testing of electrical paths through a circuit assembly is presented. The device may include a test facilitating shipping and handling cover for a socket of the circuit assembly. The test facilitating shipping and handling cover may have a conductive layer for capacitively coupling to an array of pins in the socket during testing. A method for testing continuity of electrical paths through a circuit assembly is presented. In the method, one or more nodes of the circuit assembly are stimulated, contacts of a socket on the circuit assembly are capacitively coupled with a conductive layer of a shipping and handling cover mated with the socket, and an electrical characteristic is measured by a tester coupled to the shipping and handling cover to determine continuity of electrical paths through the circuit assembly.

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EP 0653642 A1, date of publication of application: May 17, 2005, David T Crook, System for measuring the integrity of an electrical contact.
EP 0805356 A3, Date of publication: Apr. 22, 1998, Kenneth P Parker, et al, Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry.
WO 99/18447, International Publication Date: Apr. 15, 1999, James E Johnson, et al Burn-in board with adaptable heat sink device.

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