Test strip ejection mechanism

Chemical apparatus and process disinfecting – deodorizing – preser – Analyzer – structured indicator – or manipulative laboratory... – Structured visual or optical indicator – per se

Reexamination Certificate

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Details

C422S063000, C422S082050, C422S400000, C422S402000, C422S430000, C204S400000, C600S583000, C600S584000

Reexamination Certificate

active

08057753

ABSTRACT:
A test strip ejection mechanism, for use with a test strip receiving port and a test strip, includes a framework, an elongated shape memory alloy (SMA) strip (e.g., a SMA wire), a slider, and a heating module. The SMA strip has first and second ends that are attached to the framework and exhibits a solid state transition temperature. The slider is configured to travel along the framework. The heating module is configured to heat the SMA strip from a temperature below the solid state transition temperature to a temperature above the solid state transition temperature. Moreover, the SMA strip and slider are configured such that the slider travels along the framework under an applied force exerted on the slider by the SMA strip as the shape memory strip is heated from a temperature below the solid state transition temperature to a temperature above the solid state temperature by the heating module. In addition, the slider has a proximal end configured to engage a test strip received within a test strip receiving port and eject the test strip from the test strip receiving port as the slider travels along the framework. A test meter for use with a test strip includes a test strip receiving port and a test strip ejection mechanism.

REFERENCES:
patent: 5266179 (1993-11-01), Nankai et al.
patent: 5366609 (1994-11-01), White et al.
patent: 5738244 (1998-04-01), Charlton et al.
patent: 5831820 (1998-11-01), Huang
patent: 6849052 (2005-02-01), Uchigaki et al.
patent: 6916159 (2005-07-01), Rush et al.
patent: 7138089 (2006-11-01), Aitken et al.
patent: 7155828 (2007-01-01), Guimont et al.
patent: 7264139 (2007-09-01), Brickwood et al.
patent: 7337918 (2008-03-01), Fowler et al.
patent: 7566419 (2009-07-01), Schulat et al.
patent: 2004/0035687 (2004-02-01), von Behrens et al.
patent: 2004/0138588 (2004-07-01), Saikley et al.
patent: 2006/0099108 (2006-05-01), List et al.
patent: 2007/0170200 (2007-07-01), Chambers et al.
patent: 2008/0299009 (2008-12-01), Angelides
patent: 2009/0035120 (2009-02-01), List
patent: 2009/0108013 (2009-04-01), Van Der Velde et al.
patent: 2009/0112155 (2009-04-01), Zhao et al.
patent: 1238632 (2011-05-01), None
patent: WO 2007/147494 (2007-12-01), None
patent: WO 2009/055643 (2009-04-01), None
patent: WO 2009055643 (2009-04-01), None
International Search Report, PCT/GB2011/000142, dated May 23, 2011, 11 pages.
International Search Report, PCT/GB2011/000143, dated Jun. 6, 2011, 11 pages.

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