Test station for sequential testing

Details Test station for sequential testing Test station for sequential testing

1997-12-31

2001-05-15

Metjahic, Safet (Department: 2858)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S754090

Reexamination Certificate

active

06232766

ABSTRACT:

FIELD OF THE INVENTION
The subject invention relates to testing of electronic circuitry and, more particularly, to an apparatus for sequentially performing testing at a first test station that operates in connection with automated test equipment.
BACKGROUND OF THE INVENTION
As the complexity of electronic equipment, especially computer-controlled or microprocessor-based, equipment, evolves, the requirements associated to testing such equipment escalate. Consequently, the direct and indirect costs of necessary test operations become a significant component of the cost of manufacturing or repairing the equipment. Testing costs may be manifest in numerous ways: the cost of acquiring and maintaining test equipment and test systems; the time occupied in performing testing procedures; and, less frequently recognized, the amount of manufacturing floor space occupied by the test equipment and system.
Accordingly, it is an object of this invention to provide a testing apparatus and method that readily accommodate the testing of various kinds of electronic equipment.
It is another object of this invention that the testing take advantage of proven, required or available automated test equipment (ATE).
It is a further object of this invention that the expense of acquiring and maintaining test equipment be minimized.
SUMMARY OF THE INVENTION
The above and other objects, advantages and capabilities are achieved in one aspect of the invention by test station for use with automated test equipment in testing printed circuit boards (PCBs). eThe test station comprises a support frame to which are attached substantially identical test wells for sequentially performing tests on the PCBs. The test wells are attached to the frame through a mechanism that allows the test wells to be adjustably positioned between an idle position and a testing position that is in proximity with the ATE. The test wells contain upper and lower conveyor segments and a test head disposed between the conveyor segments. The conveyor segments variously align in accordance with vertical movement of the test wells so as to enable transverse movement of the PCBs into, through and out of the test station.


REFERENCES:
patent: 5614819 (1997-03-01), Nucci
patent: 5680936 (1997-10-01), Beers
patent: 5848705 (1998-12-01), Gianpaolo et al.

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