Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-06-21
2005-06-21
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
06909298
ABSTRACT:
A test socket (600) includes first (602) and second (606) test leads and a first electrically conductive member (604). The first test lead is adapted to contact a first external inductor terminal of an integrated circuit (706). The second test lead (606) is adapted to contact a second external inductor terminal of the integrated circuit (706). The first electrically conductive member (604) extends between the first test lead (602) and the second test lead (606), thereby forming an inductance loop between the first external inductor terminal and the second external inductor terminal.
REFERENCES:
patent: 5734176 (1998-03-01), Oldfield
patent: 5929649 (1999-07-01), Cramer
patent: 6252289 (2001-06-01), Thompson et al.
patent: 6323735 (2001-11-01), Welland et al.
patent: 6541988 (2003-04-01), Dangelmayer et al.
patent: 6838890 (2005-01-01), Tervo et al.
Do Vu N.
Dougherty Justin E.
Gabriel, III Martin J.
Griffin David H.
Nguyen Vinh P.
Polansky Paul J.
Silicon Laboratories Inc.
Toler Larson & Abel, LLP
LandOfFree
Test socket with integral inductor and method of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test socket with integral inductor and method of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test socket with integral inductor and method of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3503263