Test socket for semiconductor components having serviceable...

Details Test socket for semiconductor components having serviceable... Test socket for semiconductor components having serviceable...

2006-02-14

2006-02-14

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S760020, C324S1540PB, C324S765010, C324S758010

Reexamination Certificate

active

06998862

ABSTRACT:
A test socket for a semiconductor component includes a base, a movable lid, socket contacts for electrically engaging terminal contacts on the component, and a retention mechanism for the component. The test socket is movable from a loading/unloading position, in which the component can be loaded or unloaded, to a testing position, in which the component is retained by the retention mechanism in electrical communication with the socket contacts. The test socket also includes a nest for aligning the component, which is configured for removal or installation in the testing position of the test socket without interference from the retention mechanism. A test method includes the steps of providing the test socket, removing the nest and installing a replacement nest with the test socket in the testing position, and testing a different component using the replacement nest. A test system includes a burn-in board, the test socket on the burn-in board, and a testing circuitry in electrical communication with the burn-in board.

REFERENCES:
patent: 5223785 (1993-06-01), Becker
patent: 5267395 (1993-12-01), Jones, Jr. et al.
patent: 5290192 (1994-03-01), Espenshade et al.
patent: 5376010 (1994-12-01), Petersen
patent: 5409392 (1995-04-01), Marks et al.
patent: 5410257 (1995-04-01), Swaffield
patent: 5414370 (1995-05-01), Hashinaga et al.
patent: 5658153 (1997-08-01), Ikeya et al.
patent: 5690281 (1997-11-01), Ikeya et al.
patent: 6072322 (2000-06-01), Viswanath et al.
patent: 6072326 (2000-06-01), Akram et al.
patent: 6083013 (2000-07-01), Yamagishi
patent: 6181149 (2001-01-01), Godfrey et al.
patent: 6209194 (2001-04-01), Kang et al.
patent: 6264479 (2001-07-01), Ozawa
patent: 6326688 (2001-12-01), Ochiai
patent: 6351034 (2002-02-01), Farnworth et al.
patent: 6396291 (2002-05-01), Akram et al.
patent: 6441628 (2002-08-01), Farnworth et al.
patent: 6489673 (2002-12-01), Arnold et al.
patent: 6741089 (2004-05-01), Conroy
patent: 2003/0016038 (2003-01-01), Frankowsky

Affiliated with

Also associated with

Rating

Test socket for semiconductor components having serviceable... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test socket for semiconductor components having serviceable..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test socket for semiconductor components having serviceable... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3643121