Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2007-12-20
2009-08-25
Nguyen, Ha Tran T. (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
C439S091000, C439S066000
Reexamination Certificate
active
07579826
ABSTRACT:
The present invention relates to a test socket for a semiconductor device, which may correspond to a narrow pitch of terminal interval and high speed test in a simplified structure, thereby reducing manufacturing cost thereof. The test socket for a semiconductor device includes conductive substrates having contact point parts exposed at upper and lower surfaces for contacting the terminals of the semiconductor device and the lead terminals of the test board, and slant parts connecting the contact point parts and facing each other in repetitive arrangement, and an insulating elastic element filled in positions where the slant parts are formed as the contact point parts of the conductive substrate are exposed to the outside so as to fix the conductive substrates.
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Isla Rodas Richard
Nguyen Ha Tran T.
Porter Wright Morris & Arthur LLP
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